AN1785
Title:
ESD and EOS Causes, Differences and Prevention
Author:
Padmaraja Yedamale, Enrique Aleman
Description:
In many microcontroller-based applications, the microcontroller is subjected to various types of electromagnetic noise. Electrical noises may cause undesirable behavior on the application. Two of these types of noise events are referred to as Electrostatic Discharge (ESD) and Electrical Overstress (EOS). This application note discusses these two types of events, what causes them and how to minimize the impact of them on the application.
Keywords:
ESD; EOS; HBM; Electrostatic Noise
