AN1317

Title:
mTouch Conducted Noise Immunity Techniques for the CTMU
Name:
AN1317
Date:
05/19/2010
Author:
Mihnea Rosu-Hamzescu
Description:
This application note describes the use of special algorithms and techniques with Microchip's Charge Time Measurement Unit (CTMU) for capacitive touch applications in noisy environments.
Keywords:
mTouch, CTMU, charge time measurement unit, noise immunity, DS01317, 01317, AN1317
 
Application Notes & Source Code
 Last Updated
Size
 
  AN1317
  05/12/2010
  1100KB
  AN1317 Source Code for PIC24F MCU using CTMU sensing method
  04/25/2014
  228KB
Silicon Products