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AN1317

Title:
mTouch Conducted Noise Immunity Techniques for the CTMU
Name:
AN1317
Date:
05/12/2010
Author:
Mihnea Rosu-Hamzescu
Description:
This application note describes the use of special algorithms and techniques with Microchip's Charge Time Measurement Unit (CTMU) for capacitive touch applications in noisy environments.
Keywords:
mTouch, CTMU, charge time measurement unit, noise immunity, DS01317, 01317, AN1317
 
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