We detect you are using an unsupported browser. For the best experience, please visit the site using Chrome, Firefox, Safari, or Edge. X
Maximize Your Experience: Reap the Personalized Advantages by Completing Your Profile to Its Fullest. Update Here
Stay in the loop with the latest from Microchip. Update your profile while you are at it. Update Here
Complete your profile to access more resources. Update Here
Cross-reference search

53100A Phase Noise Analyzer

Small-Form-Factor Test Set for Precision Oscillator Characterization

The 53100A measures the amplitude, phase and frequency stability of high-performance RF sources. It tells you everything you need to know about the stability characteristics of your devices at timescales ranging from femtoseconds to days. The 53100A can be used on a bench-top or embedded into rackmount Automated Test Equipment (ATE) systems. Its small form factor and industry-leading measurement speed makes this test set versatile for multiple applications.

Expanding upon the heritage of the 3120A and 51XXA series of instruments, the 53100A makes fast yet accurate Single Side Band (SSB) phase noise and Allan Deviation (ADEV) measurements at a fraction of the cost of other solutions. Featuring an improved design and advancements in manufacturing, the 53100A offers improvements in reliability and performance over predecessor technologies.

Key Features

  • Internal Reference (IR) options for OCXOs and atomic clocks
  • ADEV typically less than 5E–15 at t = 1s; 1E–16 at t = 1000s
  • Measures up to three devices simultaneously
  • Close-to-carrier phase noise and AM noise at offsets from 0.001 Hz
  • Single- or dual-reference oscillator inputs allow cross-correlation measurements with noise floor approaching −175 dBc/Hz
  • Modified Allan Deviation (MDEV), Hadamard Deviation (HDEV) and Time Deviation (TDEV)
  • Jitter, residual FM and SSB carrier/noise ratio
  • Independent input and reference frequencies from 1 to 200 MHz
  • No phase locking or measurement calibration required
Download Our White Papers

Available Models

Model Part Number Description
090-53100-000 53100A Phase Noise Analyzer, Base Configuration
090-53100-001 53100A With IR Option
090-53100-002 53100A With IR and STD Options

53100A Measurement Noise Floor

Video

Explore Phase Noise With the 53100A

Whether you’re working in telecommunication, aerospace or defense, the stability and accuracy of your RF signals are essential for success. In this video, we will show you how to measure your oscillators using the 53100A Phase Noise Analyzer.

To view this video, please click manage cookies below and accept functional cookies.
Manage Cookies

Documentation

Application Notes

AN3526 - Dual Reference Noise and Stability Measurements with the 53100A Phase Noise Analyzer
Link
PDF
Oscillator Measurement and Calibration with the 53100A Phase Noise Analyzer
Link
PDF
UHF and Microwave Measurements with the 53100A Phase Noise Analyzer
Link
PDF
AN4941 - Option IR and STD for the 53100A Phase Noise Analyzer
Link
PDF

Brochures

53100A Phase Noise Analyzer Data Sheet
PDF

User Guides

53100A Phase Noise Analyzer User's Guide
PDF

Design Help

Need Help Choosing a Product for Your Design?

Our Client Support team is here to support you. Use the link below to schedule a call with a member of our team, use our live chat widget in the bottom right corner or submit a question for assistance and we will follow up with you as soon as possible.











Client Support Team

Find Local Sales and Support

We have an extensive network of highly trained clock and timing experts. Go to our listing to locate a sales and support representative in your country.

Sales and Support Representatives

Access Our Support Portal

Visit our Frequency and Time Systems support portal to download technical documents and other resources, enter support tickets or open RMA service requests.

Support Portal

Live Chat

Need Help?

Privacy Policy