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AN1785-1
| Title |
Title
ESD and EOS Causes, Differences and Prevention
|
|---|---|
| Name |
Name
AN1785-1
|
| Date |
Date
06/24/2015
|
| Application Categories |
Application Categories
Automotive /
Safety
Functional Enablement /
System & Safety Management
|
| Description |
Description
In many microcontroller-based applications, the microcontroller is subjected to various types of electromagnetic noise. Electrical noises may cause undesirable behavior on the application. Two of these types of noise events are referred to as Electrostatic Discharge (ESD) and Electrical Overstress (EOS). This application note discusses these two types of events, what causes them and how to minimize the impact of them on the application.
|