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EEPROM Triple Test

Triple Test Advantages

Field failures hurt everyone. Reduce them today with our triple-tested parts. Here are some reasons why you should choose our EEPROMs:

  • Market-leading product line in both densities and breadth of package options
  • Parts stay in the field longer because of their exceptional endurance
  • Backed by our customer-driven obsolescence practice of continuing to supply a product for as long as possible while demand for the product exists
  • Special offering include serial numbers, tracking numbers, two-pin, four-pin, MAC addresses and other options 
Video

EEPROM Triple Test

Our lab tests show some surprising results on EEPROM lasting quality. This three-minute video discusses the results.

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Why Our Parts Are Better

Test 1: First Wafer Probe

  • Every die receives 100% AC/DC testing of all data sheet parameters
    at 85°C or 125°C
  • All bits are erased and written up to 5000 times to weed out any failures

High-Temperature Retention Bake

  • Every sorted wafer undergoes a 5- to 24-hour retention bake at 250°C

Test 2: Second Wafer Probe

  • Every die is compared to its own first wafer probe results
  • Other part mortality testing is added to further eliminate field failures

Test 3: Final Test

  • Final packaged product testing verifies data sheet compliance

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