CryptoAuthLib
Atmel CryptoAuthentication Library
test_atcacert_date.c File Reference

cert date tests More...

#include "atcacert/atcacert_date.h"
#include "test/unity.h"
#include "test/unity_fixture.h"
#include <string.h>

Functions

 TEST_GROUP (atcacert_date_enc_iso8601_sep)
 
 TEST_SETUP (atcacert_date_enc_iso8601_sep)
 
 TEST_TEAR_DOWN (atcacert_date_enc_iso8601_sep)
 
 TEST (atcacert_date_enc_iso8601_sep, good)
 
 TEST (atcacert_date_enc_iso8601_sep, min)
 
 TEST (atcacert_date_enc_iso8601_sep, max)
 
 TEST (atcacert_date_enc_iso8601_sep, bad_year)
 
 TEST (atcacert_date_enc_iso8601_sep, bad_month)
 
 TEST (atcacert_date_enc_iso8601_sep, bad_day)
 
 TEST (atcacert_date_enc_iso8601_sep, bad_hour)
 
 TEST (atcacert_date_enc_iso8601_sep, bad_min)
 
 TEST (atcacert_date_enc_iso8601_sep, bad_sec)
 
 TEST (atcacert_date_enc_iso8601_sep, bad_params)
 
 TEST_GROUP (atcacert_date_enc_rfc5280_utc)
 
 TEST_SETUP (atcacert_date_enc_rfc5280_utc)
 
 TEST_TEAR_DOWN (atcacert_date_enc_rfc5280_utc)
 
 TEST (atcacert_date_enc_rfc5280_utc, good)
 
 TEST (atcacert_date_enc_rfc5280_utc, min)
 
 TEST (atcacert_date_enc_rfc5280_utc, max)
 
 TEST (atcacert_date_enc_rfc5280_utc, y2k)
 
 TEST (atcacert_date_enc_rfc5280_utc, bad_year)
 
 TEST (atcacert_date_enc_rfc5280_utc, bad_month)
 
 TEST (atcacert_date_enc_rfc5280_utc, bad_day)
 
 TEST (atcacert_date_enc_rfc5280_utc, bad_hour)
 
 TEST (atcacert_date_enc_rfc5280_utc, bad_min)
 
 TEST (atcacert_date_enc_rfc5280_utc, bad_sec)
 
 TEST (atcacert_date_enc_rfc5280_utc, bad_params)
 
 TEST_GROUP (atcacert_date_enc_posix_uint32_be)
 
 TEST_SETUP (atcacert_date_enc_posix_uint32_be)
 
 TEST_TEAR_DOWN (atcacert_date_enc_posix_uint32_be)
 
 TEST (atcacert_date_enc_posix_uint32_be, good)
 
 TEST (atcacert_date_enc_posix_uint32_be, min)
 
 TEST (atcacert_date_enc_posix_uint32_be, large)
 
 TEST (atcacert_date_enc_posix_uint32_be, max)
 
 TEST (atcacert_date_enc_posix_uint32_be, bad_low)
 
 TEST (atcacert_date_enc_posix_uint32_be, bad_high)
 
 TEST (atcacert_date_enc_posix_uint32_be, bad_params)
 
 TEST_GROUP (atcacert_date_enc_posix_uint32_le)
 
 TEST_SETUP (atcacert_date_enc_posix_uint32_le)
 
 TEST_TEAR_DOWN (atcacert_date_enc_posix_uint32_le)
 
 TEST (atcacert_date_enc_posix_uint32_le, good)
 
 TEST (atcacert_date_enc_posix_uint32_le, min)
 
 TEST (atcacert_date_enc_posix_uint32_le, large)
 
 TEST (atcacert_date_enc_posix_uint32_le, max)
 
 TEST (atcacert_date_enc_posix_uint32_le, bad_low)
 
 TEST (atcacert_date_enc_posix_uint32_le, bad_high)
 
 TEST (atcacert_date_enc_posix_uint32_le, bad_params)
 
 TEST_GROUP (atcacert_date_enc_rfc5280_gen)
 
 TEST_SETUP (atcacert_date_enc_rfc5280_gen)
 
 TEST_TEAR_DOWN (atcacert_date_enc_rfc5280_gen)
 
 TEST (atcacert_date_enc_rfc5280_gen, good)
 
 TEST (atcacert_date_enc_rfc5280_gen, min)
 
 TEST (atcacert_date_enc_rfc5280_gen, max)
 
 TEST (atcacert_date_enc_rfc5280_gen, bad_year)
 
 TEST (atcacert_date_enc_rfc5280_gen, bad_month)
 
 TEST (atcacert_date_enc_rfc5280_gen, bad_day)
 
 TEST (atcacert_date_enc_rfc5280_gen, bad_hour)
 
 TEST (atcacert_date_enc_rfc5280_gen, bad_min)
 
 TEST (atcacert_date_enc_rfc5280_gen, bad_sec)
 
 TEST (atcacert_date_enc_rfc5280_gen, bad_params)
 
 TEST_GROUP (atcacert_date_enc_compcert)
 
 TEST_SETUP (atcacert_date_enc_compcert)
 
 TEST_TEAR_DOWN (atcacert_date_enc_compcert)
 
 TEST (atcacert_date_enc_compcert, good)
 
 TEST (atcacert_date_enc_compcert, min)
 
 TEST (atcacert_date_enc_compcert, max)
 
 TEST (atcacert_date_enc_compcert, bad_year)
 
 TEST (atcacert_date_enc_compcert, bad_month)
 
 TEST (atcacert_date_enc_compcert, bad_day)
 
 TEST (atcacert_date_enc_compcert, bad_hour)
 
 TEST (atcacert_date_enc_compcert, bad_expire)
 
 TEST (atcacert_date_enc_compcert, bad_params)
 
 TEST_GROUP (atcacert_date_enc)
 
 TEST_SETUP (atcacert_date_enc)
 
 TEST_TEAR_DOWN (atcacert_date_enc)
 
 TEST (atcacert_date_enc, iso8601_sep)
 
 TEST (atcacert_date_enc, rfc5280_utc)
 
 TEST (atcacert_date_enc, posix_uint32_be)
 
 TEST (atcacert_date_enc, posix_uint32_le)
 
 TEST (atcacert_date_enc, rfc5280_gen)
 
 TEST (atcacert_date_enc, small_buf)
 
 TEST (atcacert_date_enc, bad_format)
 
 TEST (atcacert_date_enc, bad_params)
 
 TEST_GROUP (atcacert_date_dec_iso8601_sep)
 
 TEST_SETUP (atcacert_date_dec_iso8601_sep)
 
 TEST_TEAR_DOWN (atcacert_date_dec_iso8601_sep)
 
 TEST (atcacert_date_dec_iso8601_sep, good)
 
 TEST (atcacert_date_dec_iso8601_sep, min)
 
 TEST (atcacert_date_dec_iso8601_sep, max)
 
 TEST (atcacert_date_dec_iso8601_sep, bad_int)
 
 TEST (atcacert_date_dec_iso8601_sep, bad_params)
 
 TEST_GROUP (atcacert_date_dec_rfc5280_utc)
 
 TEST_SETUP (atcacert_date_dec_rfc5280_utc)
 
 TEST_TEAR_DOWN (atcacert_date_dec_rfc5280_utc)
 
 TEST (atcacert_date_dec_rfc5280_utc, good)
 
 TEST (atcacert_date_dec_rfc5280_utc, min)
 
 TEST (atcacert_date_dec_rfc5280_utc, max)
 
 TEST (atcacert_date_dec_rfc5280_utc, y2k)
 
 TEST (atcacert_date_dec_rfc5280_utc, bad_int)
 
 TEST (atcacert_date_dec_rfc5280_utc, bad_params)
 
 TEST_GROUP (atcacert_date_dec_posix_uint32_be)
 
 TEST_SETUP (atcacert_date_dec_posix_uint32_be)
 
 TEST_TEAR_DOWN (atcacert_date_dec_posix_uint32_be)
 
 TEST (atcacert_date_dec_posix_uint32_be, good)
 
 TEST (atcacert_date_dec_posix_uint32_be, min)
 
 TEST (atcacert_date_dec_posix_uint32_be, int32_max)
 
 TEST (atcacert_date_dec_posix_uint32_be, large)
 
 TEST (atcacert_date_dec_posix_uint32_be, max)
 
 TEST (atcacert_date_dec_posix_uint32_be, bad_params)
 
 TEST_GROUP (atcacert_date_dec_posix_uint32_le)
 
 TEST_SETUP (atcacert_date_dec_posix_uint32_le)
 
 TEST_TEAR_DOWN (atcacert_date_dec_posix_uint32_le)
 
 TEST (atcacert_date_dec_posix_uint32_le, good)
 
 TEST (atcacert_date_dec_posix_uint32_le, min)
 
 TEST (atcacert_date_dec_posix_uint32_le, int32_max)
 
 TEST (atcacert_date_dec_posix_uint32_le, large)
 
 TEST (atcacert_date_dec_posix_uint32_le, max)
 
 TEST (atcacert_date_dec_posix_uint32_le, bad_params)
 
 TEST_GROUP (atcacert_date_dec_rfc5280_gen)
 
 TEST_SETUP (atcacert_date_dec_rfc5280_gen)
 
 TEST_TEAR_DOWN (atcacert_date_dec_rfc5280_gen)
 
 TEST (atcacert_date_dec_rfc5280_gen, good)
 
 TEST (atcacert_date_dec_rfc5280_gen, min)
 
 TEST (atcacert_date_dec_rfc5280_gen, max)
 
 TEST (atcacert_date_dec_rfc5280_gen, bad_int)
 
 TEST (atcacert_date_dec_rfc5280_gen, bad_params)
 
 TEST_GROUP (atcacert_date_get_max_date)
 
 TEST_SETUP (atcacert_date_get_max_date)
 
 TEST_TEAR_DOWN (atcacert_date_get_max_date)
 
 TEST (atcacert_date_get_max_date, iso8601_sep)
 
 TEST (atcacert_date_get_max_date, rfc5280_utc)
 
 TEST (atcacert_date_get_max_date, posix_uint32_be)
 
 TEST (atcacert_date_get_max_date, posix_uint32_le)
 
 TEST (atcacert_date_get_max_date, rfc5280_gen)
 
 TEST (atcacert_date_get_max_date, new_format)
 
 TEST (atcacert_date_get_max_date, bad_params)
 
 TEST_GROUP (atcacert_date_dec_compcert)
 
 TEST_SETUP (atcacert_date_dec_compcert)
 
 TEST_TEAR_DOWN (atcacert_date_dec_compcert)
 
 TEST (atcacert_date_dec_compcert, good)
 
 TEST (atcacert_date_dec_compcert, min)
 
 TEST (atcacert_date_dec_compcert, max)
 
 TEST (atcacert_date_dec_compcert, posix_uint32_be)
 
 TEST (atcacert_date_dec_compcert, bad_params)
 
 TEST_GROUP (atcacert_date_dec)
 
 TEST_SETUP (atcacert_date_dec)
 
 TEST_TEAR_DOWN (atcacert_date_dec)
 
 TEST (atcacert_date_dec, iso8601_sep)
 
 TEST (atcacert_date_dec, rfc5280_utc)
 
 TEST (atcacert_date_dec, posix_uint32_be)
 
 TEST (atcacert_date_dec, posix_uint32_le)
 
 TEST (atcacert_date_dec, rfc5280_gen)
 
 TEST (atcacert_date_dec, small_buf)
 
 TEST (atcacert_date_dec, bad_format)
 
 TEST (atcacert_date_dec, bad_params)
 

Detailed Description

cert date tests

Function Documentation

TEST ( atcacert_date_enc_iso8601_sep  ,
good   
)
TEST ( atcacert_date_enc_iso8601_sep  ,
bad_year   
)
TEST ( atcacert_date_enc_iso8601_sep  ,
bad_month   
)
TEST ( atcacert_date_enc_iso8601_sep  ,
bad_day   
)
TEST ( atcacert_date_enc_iso8601_sep  ,
bad_hour   
)
TEST ( atcacert_date_enc_iso8601_sep  ,
bad_min   
)
TEST ( atcacert_date_enc_iso8601_sep  ,
bad_sec   
)
TEST ( atcacert_date_enc_iso8601_sep  ,
bad_params   
)
TEST ( atcacert_date_enc_rfc5280_utc  ,
good   
)
TEST ( atcacert_date_enc_rfc5280_utc  ,
y2k   
)
TEST ( atcacert_date_enc_rfc5280_utc  ,
bad_year   
)
TEST ( atcacert_date_enc_rfc5280_utc  ,
bad_month   
)
TEST ( atcacert_date_enc_rfc5280_utc  ,
bad_day   
)
TEST ( atcacert_date_enc_rfc5280_utc  ,
bad_hour   
)
TEST ( atcacert_date_enc_rfc5280_utc  ,
bad_min   
)
TEST ( atcacert_date_enc_rfc5280_utc  ,
bad_sec   
)
TEST ( atcacert_date_enc_rfc5280_utc  ,
bad_params   
)
TEST ( atcacert_date_enc_posix_uint32_be  ,
good   
)
TEST ( atcacert_date_enc_posix_uint32_be  ,
large   
)
TEST ( atcacert_date_enc_posix_uint32_be  ,
bad_low   
)
TEST ( atcacert_date_enc_posix_uint32_be  ,
bad_high   
)
TEST ( atcacert_date_enc_posix_uint32_be  ,
bad_params   
)
TEST ( atcacert_date_enc_posix_uint32_le  ,
good   
)
TEST ( atcacert_date_enc_posix_uint32_le  ,
large   
)
TEST ( atcacert_date_enc_posix_uint32_le  ,
bad_low   
)
TEST ( atcacert_date_enc_posix_uint32_le  ,
bad_high   
)
TEST ( atcacert_date_enc_posix_uint32_le  ,
bad_params   
)
TEST ( atcacert_date_enc_rfc5280_gen  ,
good   
)
TEST ( atcacert_date_enc_rfc5280_gen  ,
bad_year   
)
TEST ( atcacert_date_enc_rfc5280_gen  ,
bad_month   
)
TEST ( atcacert_date_enc_rfc5280_gen  ,
bad_day   
)
TEST ( atcacert_date_enc_rfc5280_gen  ,
bad_hour   
)
TEST ( atcacert_date_enc_rfc5280_gen  ,
bad_min   
)
TEST ( atcacert_date_enc_rfc5280_gen  ,
bad_sec   
)
TEST ( atcacert_date_enc_rfc5280_gen  ,
bad_params   
)
TEST ( atcacert_date_enc_compcert  ,
good   
)
TEST ( atcacert_date_enc_compcert  ,
min   
)
TEST ( atcacert_date_enc_compcert  ,
max   
)
TEST ( atcacert_date_enc_compcert  ,
bad_year   
)
TEST ( atcacert_date_enc_compcert  ,
bad_month   
)
TEST ( atcacert_date_enc_compcert  ,
bad_day   
)
TEST ( atcacert_date_enc_compcert  ,
bad_hour   
)
TEST ( atcacert_date_enc_compcert  ,
bad_expire   
)
TEST ( atcacert_date_enc_compcert  ,
bad_params   
)
TEST ( atcacert_date_enc  ,
iso8601_sep   
)
TEST ( atcacert_date_enc  ,
rfc5280_utc   
)
TEST ( atcacert_date_enc  ,
posix_uint32_be   
)
TEST ( atcacert_date_enc  ,
posix_uint32_le   
)
TEST ( atcacert_date_enc  ,
rfc5280_gen   
)
TEST ( atcacert_date_enc  ,
small_buf   
)
TEST ( atcacert_date_enc  ,
bad_format   
)
TEST ( atcacert_date_enc  ,
bad_params   
)
TEST ( atcacert_date_dec_iso8601_sep  ,
good   
)
TEST ( atcacert_date_dec_iso8601_sep  ,
bad_int   
)
TEST ( atcacert_date_dec_iso8601_sep  ,
bad_params   
)
TEST ( atcacert_date_dec_rfc5280_utc  ,
good   
)
TEST ( atcacert_date_dec_rfc5280_utc  ,
y2k   
)
TEST ( atcacert_date_dec_rfc5280_utc  ,
bad_int   
)
TEST ( atcacert_date_dec_rfc5280_utc  ,
bad_params   
)
TEST ( atcacert_date_dec_posix_uint32_be  ,
good   
)
TEST ( atcacert_date_dec_posix_uint32_be  ,
int32_max   
)
TEST ( atcacert_date_dec_posix_uint32_be  ,
large   
)
TEST ( atcacert_date_dec_posix_uint32_be  ,
bad_params   
)
TEST ( atcacert_date_dec_posix_uint32_le  ,
good   
)
TEST ( atcacert_date_dec_posix_uint32_le  ,
int32_max   
)
TEST ( atcacert_date_dec_posix_uint32_le  ,
large   
)
TEST ( atcacert_date_dec_posix_uint32_le  ,
bad_params   
)
TEST ( atcacert_date_dec_rfc5280_gen  ,
good   
)
TEST ( atcacert_date_dec_rfc5280_gen  ,
bad_int   
)
TEST ( atcacert_date_dec_rfc5280_gen  ,
bad_params   
)
TEST ( atcacert_date_get_max_date  ,
iso8601_sep   
)
TEST ( atcacert_date_get_max_date  ,
rfc5280_utc   
)
TEST ( atcacert_date_get_max_date  ,
posix_uint32_be   
)
TEST ( atcacert_date_get_max_date  ,
posix_uint32_le   
)
TEST ( atcacert_date_get_max_date  ,
rfc5280_gen   
)
TEST ( atcacert_date_get_max_date  ,
new_format   
)
TEST ( atcacert_date_get_max_date  ,
bad_params   
)
TEST ( atcacert_date_dec_compcert  ,
good   
)
TEST ( atcacert_date_dec_compcert  ,
min   
)
TEST ( atcacert_date_dec_compcert  ,
max   
)
TEST ( atcacert_date_dec_compcert  ,
posix_uint32_be   
)
TEST ( atcacert_date_dec_compcert  ,
bad_params   
)
TEST ( atcacert_date_dec  ,
iso8601_sep   
)
TEST ( atcacert_date_dec  ,
rfc5280_utc   
)
TEST ( atcacert_date_dec  ,
posix_uint32_be   
)
TEST ( atcacert_date_dec  ,
posix_uint32_le   
)
TEST ( atcacert_date_dec  ,
rfc5280_gen   
)
TEST ( atcacert_date_dec  ,
small_buf   
)
TEST ( atcacert_date_dec  ,
bad_format   
)
TEST ( atcacert_date_dec  ,
bad_params   
)
TEST_GROUP ( atcacert_date_enc_compcert  )
TEST_GROUP ( atcacert_date_enc  )
TEST_GROUP ( atcacert_date_get_max_date  )
TEST_GROUP ( atcacert_date_dec_compcert  )
TEST_GROUP ( atcacert_date_dec  )
TEST_SETUP ( atcacert_date_enc_compcert  )
TEST_SETUP ( atcacert_date_enc  )
TEST_SETUP ( atcacert_date_get_max_date  )
TEST_SETUP ( atcacert_date_dec_compcert  )
TEST_SETUP ( atcacert_date_dec  )
TEST_TEAR_DOWN ( atcacert_date_enc_iso8601_sep  )
TEST_TEAR_DOWN ( atcacert_date_enc_rfc5280_utc  )
TEST_TEAR_DOWN ( atcacert_date_enc_posix_uint32_be  )
TEST_TEAR_DOWN ( atcacert_date_enc_posix_uint32_le  )
TEST_TEAR_DOWN ( atcacert_date_enc_rfc5280_gen  )
TEST_TEAR_DOWN ( atcacert_date_enc_compcert  )
TEST_TEAR_DOWN ( atcacert_date_enc  )
TEST_TEAR_DOWN ( atcacert_date_dec_iso8601_sep  )
TEST_TEAR_DOWN ( atcacert_date_dec_rfc5280_utc  )
TEST_TEAR_DOWN ( atcacert_date_dec_posix_uint32_be  )
TEST_TEAR_DOWN ( atcacert_date_dec_posix_uint32_le  )
TEST_TEAR_DOWN ( atcacert_date_dec_rfc5280_gen  )
TEST_TEAR_DOWN ( atcacert_date_get_max_date  )
TEST_TEAR_DOWN ( atcacert_date_dec_compcert  )
TEST_TEAR_DOWN ( atcacert_date_dec  )