4. Components

• 4.1. Main Application
  • 4.1.1. Implementation Notes
• 4.2. ADC Calibration and Compensation
  • 4.2.1. Implementation Notes
• 4.3. State Machine
  • 4.3.1. States
  • 4.3.2. Input conditions
  • 4.3.3. Miscellaneous state machine issues
  • 4.3.4. Implementation Notes
• 4.4. Field-Oriented Control (FOC)
  • 4.4.1. Velocity Control
  • 4.4.2. Current Control
  • 4.4.3. Position and Velocity Estimator
  • 4.4.4. Implementation Notes
• 4.5. Test Harness
  • 4.5.1. Overview
  • 4.5.2. Accretive Testing
  • 4.5.3. Test Harness Parameters
  • 4.5.4. Test Guarding
  • 4.5.5. Test Harness Architecture
  • 4.5.6. Test harness modes
  • 4.5.7. Interaction with the System State Machine
  • 4.5.8. Test Harness Switches (Overrides)
  • 4.5.9. Perturbation Signals
  • 4.5.10. Seizures
  • 4.5.11. Profiling Timestamps
  • 4.5.12. Example use cases
  • 4.5.13. Implementation Notes
• 4.6. Supervisory Algorithms
  • 4.6.1. Implementation Notes
• 4.7. External Interface
  • 4.7.1. General UI guidelines
  • 4.7.2. Required Features
  • 4.7.3. Implemented Behavior
  • 4.7.4. Error Codes
  • 4.7.5. Timing and Fault-Clearing Issues in UI Indicators
  • 4.7.6. Implementation
• 4.8. Diagnostic Kernel
  • 4.8.1. Implementation Notes
• 4.9. Hardware Abstraction Layer (HAL)
  • 4.9.1. Hardware-related behavior
• 4.10. Miscellaneous
  • 4.10.1. Implementation Notes