Xmega IEC60730 Class B Library  1.0
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classb_analog.h
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1 /* This file has been prepared for Doxygen automatic documentation generation.*/
2 /**
3  * \file
4  *
5  * \brief
6  * This is the header file for the ADC and DAC tests.
7  *
8  * \par Application note:
9  * AVR1610: Guide to IEC60730 Class B compliance with XMEGA
10  *
11  * \par Documentation
12  * For comprehensive code documentation, supported compilers, compiler
13  * settings and supported devices see readme.html
14  *
15  * \author
16  * Atmel Corporation: http://www.atmel.com \n
17  * Support email: avr@atmel.com
18  *
19  * Copyright (C) 2012 Atmel Corporation. All rights reserved.
20  *
21  * \page License
22  *
23  * Redistribution and use in source and binary forms, with or without
24  * modification, are permitted provided that the following conditions are met:
25  *
26  * 1. Redistributions of source code must retain the above copyright notice,
27  * this list of conditions and the following disclaimer.
28  *
29  * 2. Redistributions in binary form must reproduce the above copyright notice,
30  * this list of conditions and the following disclaimer in the documentation
31  * and/or other materials provided with the distribution.
32  *
33  * 3. The name of Atmel may not be used to endorse or promote products derived
34  * from this software without specific prior written permission.
35  *
36  * 4. This software may only be redistributed and used in connection with an
37  * Atmel AVR product.
38  *
39  * THIS SOFTWARE IS PROVIDED BY ATMEL "AS IS" AND ANY EXPRESS OR IMPLIED
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41  * MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE AND NON-INFRINGEMENT ARE
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51 
52 #ifndef CLASSB_ADC_DAC_H_
53 #define CLASSB_ADC_DAC_H_
54 
55 #include "avr_compiler.h"
56 #include "error_handler.h"
57 
58 //! \defgroup adc_dac Analog I/O Test
59 //!
60 //! \brief This self-diagnostic test for the ADC, DAC and analog multiplexer.
61 //!
62 //! A plausibility check is done to make sure that ADC and DAC
63 //! work correctly. The test is implemented in \ref classb_analog_io_test() and consists on
64 //! the following: the DAC generates 5 values (0%, 25%, 50%, 75% and 100% of the scale) and
65 //! the ADC will read them. If the read values should deviate from the expected values more
66 //! than a configurable threshold, the test would call the error handler
67 //! \ref CLASSB_ERROR_HANDLER_ANALOG().
68 //!
69 //! The test checks one ADC module and one DAC module at a time, i.e. it has to be
70 //! repeated until all modules are tested. Further, the ADC module to test should
71 //! be able to read from the DAC module it is tested together with.
72 //!
73 //! \note
74 //! - Interrupts should be disabled during this test.
75 //@{
76 
77 //! \internal \name Internal settings
78 //@{
79 //! \internal \brief Maximum allowed absolute deviation for the test measurements.
80 //!
81 //! Error offset for the ADC is +-2mV, which corresponds to +-0x40 when the
82 //! reference is 1V and \c TOP is \c 2047.
83 #define CLASSB_ADC_DEV 0x40
84 //@}
85 
86 
87 //! \name Class B Test
88 //@{
89 void classb_analog_io_test(DAC_t *dacptr, ADC_t *adcptr);
90 //@}
91 
92 
93 //@}
94 
95 
96 #endif /* CLASSB_ADC_DAC_H_ */