| Xmega IEC60730 Class B Library 1.0 |

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classb_sram.h File Reference

## Detailed Description

Settings for the SRAM test.

Application note:
  AVR1610: Guide to IEC60730 Class B compliance with XMEGA

Documentation
  For comprehensive code documentation, supported compilers, compiler settings and supported devices see readme.html

Author:
  Atmel Corporation: http://www.atmel.com
  Support email: avr@a.nosp@m.tmel.nosp@m..com

Copyright (C) 2012 Atmel Corporation. All rights reserved.

Definition in file classb_sram.h.

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## Macros
Configuration settings
#define | CLASSB_NSECS 8
| Number of sections the SRAM is divided into for testing.
#define | CLASSB_OVERLAP 25UL
| Overlap between memory sections (in % of `CLASSB_SEC_SIZE`).
#define | CLASSB_SRAM_INTRAWORD_TEST
| If defined an intra-word test will be added after the inter-word test.

## Functions
Class B Test
void | classb_sram_test (void)
| This function executes March X test for a memory section at a time.